Kuwano, N. and Kaur, Jesbains * (2017) Electron microscopy determination of crystallographic polarity of aluminum nitride thin films. In: Regional Conference on Materials & ASEAN Microscopy Conference 2017 (RCM & AMC 2017), 12-13 December 2017, USM, Penang.
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| Item Type: | Conference or Workshop Item (Paper) |
|---|---|
| Uncontrolled Keywords: | electron microscopy; crystallographic polarity; wurtzite structure |
| Subjects: | Q Science > QC Physics |
| Divisions: | Sunway University > Faculty of Engineering and Technology [formerly School of Engineering and Technology until 14 November 2025; School of Science and Technology until 2020] > Research Centre for Nano-Materials and Energy Technology |
| Depositing User: | Dr Janaki Sinnasamy |
| Date Deposited: | 01 Sep 2018 05:19 |
| Last Modified: | 01 Sep 2018 05:19 |
| URI: | http://repository.sunway.edu.my/id/eprint/894 |
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